Selectable Delay Buffers and Logic Cells for Dynamic Voltage Scaling in Ultra Low Voltage Designs

ABSTRACT

Provided is a selectable delay buffer for tuning a delay path in a circuit. The selectable delay buffer comprises a first delay segment configured to pass an input signal to an output terminal within a first range of time delays, a second delay segment configured to pass the input signal to the output terminal within a second range of time delays that is different from the first range, and a segment selection switch configured to selectively couple the delay segments to the output terminal based on received selection information that indicates which delay segment to couple to the output terminal.

CROSS-REFERENCE TO RELATED APPLICATION

This application is a divisional of U.S. patent application Ser. No.15/296,603, filed Oct. 18, 2016, the contents of which is incorporatedherein by reference in its entirety.

BACKGROUND

The technology described in this patent document relates generally tocircuit design and more specifically to a delay buffer configured foroperation with a plurality of voltage and/or frequency ranges.

Improvements in circuit design techniques has enabled continuedimprovement in ultra low voltage applications. Development of improvedcircuit elements can further improve ultra low voltage circuits.

BRIEF DESCRIPTION OF THE DRAWINGS

Aspects of the present disclosure are best understood from the followingdetailed description when read with the accompanying figures. It isnoted that, in accordance with the standard practice in the industry,various features are not drawn to scale. In fact, the dimensions of thevarious features may be arbitrarily increased or reduced for clarity ofdiscussion.

FIG. 1A is a schematic diagram of an example selectable delay buffer, inaccordance with some embodiments.

FIG. 1B is an alternate schematic representation of the selectable delaybuffer 110 illustrating the signal input terminal 130, the signal outputterminal 132, and the selection input terminal 128, in accordance withsome embodiments.

FIG. 2A is a schematic diagram of another example selectable delaybuffer, in accordance with some embodiments.

FIG. 2B is an alternate schematic representation of the selectable delaybuffer 210 illustrating the selection input terminal 230, the signaloutput terminal 232, and the selection input terminal 228, in accordancewith some embodiments.

FIGS. 3A and 3B are schematic diagrams of an example synchronous VLSIlogic circuit that utilize selectable delay buffers, in accordance withsome embodiments.

FIGS. 4A and 4B are schematic diagrams of another example synchronousVLSI logic circuit that utilizes a selectable delay buffer, inaccordance with some embodiments.

FIG. 5 is a schematic diagram of an example control signal generatingcircuit for generating control signals for choosing delay paths in aselectable delay buffer, in accordance with some embodiments.

FIG. 6 is a schematic diagram of an example logic element that has beenconfigured with selectable delays, in accordance with some embodiments.

FIG. 7 is a schematic diagram of another example selectable delaybuffer.

FIG. 8 is a process flow chart depicting an example method in asynchronous circuit for tuning a delay path, in accordance with someembodiments.

DETAILED DESCRIPTION

The following disclosure provides many different embodiments, orexamples, for implementing different features of the provided subjectmatter. Specific examples of components and arrangements are describedbelow to simplify the present disclosure. These are, of course, merelyexamples and are not intended to be limiting. For example, the formationof a first feature over or on a second feature in the description thatfollows may include embodiments in which the first and second featuresare formed in direct contact, and may also include embodiments in whichadditional features may be formed between the first and second features,such that the first and second features may not be in direct contact. Inaddition, the present disclosure may repeat reference numerals and/orletters in the various examples. This repetition is for the purpose ofsimplicity and clarity and does not in itself dictate a relationshipbetween the various embodiments and/or configurations discussed.

FIG. 1A is a schematic diagram of an example selectable delay buffer110. The selectable delay buffer 110 may be used in an electroniccircuit such as a synchronous logic circuit to assist in tuning a delaypath for a clock or data signal. The example selectable delay buffer 110includes a fixed delay section 112 and an adjustable delay section 114.The fixed delay section 112 comprises a delay element such as a bufferdriver that provides a minimum fixed delay for a signal passing thru theexample selectable delay buffer 110 when operating at a particularvoltage level. The fixed delay however may be different if operating ata different voltage level.

The example adjustable delay section 114 includes a first delay segment116, a second delay segment 118, and a segment selection switch 120. Thefirst delay segment 116 in this example includes a conduction path and adelay element 122 such as a buffer driver that provides a time delayrange at a particular voltage level for a signal passing thru the firstdelay segment 116. The time delay range is bounded by a t_(min) and at_(max). The second delay segment 118 in this example includes aconduction path that provides negligible delay for a signal passing thruthe delay segment 118. The second delay segment 118 also includes a timedelay range that is bounded by a t_(min) and a t_(max), which isdifferent from the time delay range for the first delay segment 116. Thesegment selection switch 120 selectively couples the first delay segment116 and the second delay segment 118 one at a time to the input of thefixed delay section 112.

In this example, the segment selection switch 120 comprises two passgates, a PMOS FET 124 and an NMOS FET 126, with their respective inputterminals connected to the first delay segment 116 and the second delaysegment 118 and their output terminals coupled together at the input tothe fixed delay section 112. The pass gates 124, 126 are each enabled byselection information provided via a select signal applied to aselection input terminal 128 coupled to the gates of the pass gates 124,126. The selection information indicates which of the first and seconddelay segments 116, 118 to couple to the fixed delay section 112. Inthis example, when the selection information indicates a logic zerolevel, the PMOS pass gate 124 is enabled to couple the first delaysegment 116 to the input of the fixed delay section 112. This causes thetime delay for the selectable delay buffer 110 to essentially be equalto the time delay range provided by the fixed delay section 112 plus thetime delay range provided by the first delay segment 116. When theselection information indicates a logic one level, the NMOS pass gate126 is enabled to couple the second delay segment 118 to the input ofthe fixed delay section 112. This causes the time delay for theselectable delay buffer 110 to essentially be equal to the time delayrange provided by the fixed delay section 112 plus the time delay rangeprovided by the second delay segment 118.

In addition to the selection input terminal 128, the selectable delaybuffer 110 includes a signal input terminal 130 and a signal outputterminal 132. The selectable delay buffer 110 may be used in data signalpaths and clock signal paths in a synchronous logic circuit to produceat the output terminal 132 a delayed version of the signal provided atthe input terminal 130. Depicted in FIG. 1B is an alternate schematicrepresentation of the selectable delay buffer 110 illustrating thesignal input terminal 130, the signal output terminal 132, and theselection input terminal 128.

The selectable delay buffer 110 may be operated to provide one delayrange when operating at a first voltage level and a different delayrange when operating at a second voltage level. This can be accomplishedby selecting one of the delay segments when operating at a first voltagelevel and another delay segment when operating at a second voltagelevel.

FIG. 2A is a schematic diagram of another example selectable delaybuffer 210. The selectable delay buffer 210 may be used in an electroniccircuit such as a synchronous logic circuit to assist in tuning a delaypath for a clock or data signal. The example selectable delay buffer 210includes a fixed delay section 212 and an adjustable delay section 214.The fixed delay section 212 comprises a delay element such as a bufferdriver that provides a minimum fixed delay for a signal passing thru theexample selectable delay buffer 210 when operating at a particularvoltage level. The fixed delay however may be different if operating ata different voltage level.

The example adjustable delay section 214 includes a first delay segment215, a second delay segment 216, a third delay segment 217, a fourthdelay segment 218, a fifth delay segment 219, and a segment selectionswitch 220. The first delay segment 215 in this example comprises aconduction path. The second delay segment 216 comprises a conductionpath and a delay element such as a buffer driver that provides a timedelay range at a particular voltage level for a signal passing thru thedelay segment. The third delay segment 217 comprises a conduction pathand two delay elements. The fourth delay segment 218 comprises aconduction path and three delay elements. The fourth delay segment 219comprises a conduction path and four delay elements. The time delayrange for each delay segment is bounded by a unique t_(min) and t_(max)that is different from the time delay range for another delay segment.The segment selection switch 220 selectively couples the delay segments215, 216, 217, 218, 219 one at a time to the input of the fixed delaysection 212, based on received selection information that indicateswhich delay segment to couple to the fixed delay section 212 andultimately to the output terminal 232.

The segment selection switch 220 comprises a N×1 multiplexer wherein Nis equal to 5 in this example. The N×1 multiplexer 220 is controlled byselection information provided via a select signal applied to theselection input terminals 228. The selection information indicates whichof the delay segments 215, 216, 217, 218, 219 to couple to the fixeddelay section 212. In this example, the selection information comprisesthree signals applied to the selection input terminals 228. When theselection information indicates a particular delay segment, that delaysegment is coupled to the input of the fixed delay section 212. Thiscauses the time delay for the selectable delay buffer 210 to essentiallybe equal to the time delay range provided by the fixed delay section 212plus the time delay range provided by the selected delay segment.

In addition to the selection input terminal 228, the selectable delaybuffer 210 includes a signal input terminal 230 and a signal outputterminal 232. The selectable delay buffer 210 may be used in data signalpaths and clock signal paths in a synchronous logic circuit to produceat the output terminal 232 a delayed version of the signal provided atthe input terminal 230. Depicted in FIG. 2B is an alternate schematicrepresentation of the selectable delay buffer 210 illustrating thesignal input terminal 230, the signal output terminal 232, and theselection input terminal 228.

The selectable delay buffer 210 may be operated to provide a uniquedelay range for five different voltage levels. This can be accomplishedby selecting one of the delay segments when operating at a first voltagelevel, a second of the delay segments when operating at a second voltagelevel, a third of the delay segments when operating at a third voltagelevel, a fourth of the delay segments when operating at a fourth voltagelevel, and a fifth of the delay segments when operating at a fifthvoltage level.

FIGS. 3A and 3B are schematic diagrams of an example synchronous VLSIlogic circuit 300. The circuit includes a first memory element, flipflop 310, and a second memory element, flip flop 312, with a data pathand a clock path coupled between them. The data path includes aninverter 314 for inverting the output of the first memory element 310before it is stored in the second memory element 312. The clock pathincludes a buffer 316 for buffering a clock signal that is used by thefirst and second memory elements to synchronize the storage and outputof data.

To ensure the logic circuit 300 functions correctly, the data pathand/or clock path may need delay buffers inserted therein to correct forpotential hold time violations. The example logic circuit 300 may beemployed in various IoT (“internet of things”) and automotive products.Such an application may employ an ultra low voltage (ULV) design alongwith a dynamic voltage scaling (DVS) technique. Because the examplelogic circuit 300 may employ DVS usage, the circuit may need to operatecorrectly at multiple operating voltages. The example logic circuit 300includes selectable delay buffers 318 which allow for the correction ofpotential hold time violations when operating at different ULV levels.

The design sign off condition for a circuit could be determined by thelowest operating voltage. A circuit signed off at low voltage, however,when operated at a higher voltage could be over designed for maximumdelay paths and under designed for minimum delay paths. For example, theuse of a number of buffers to correct hold violations at a lower voltagesuch as 0.4V could limit the maximum operating frequency at the highervoltage such as 0.5V. For minimum delay paths, the delay buffers used at0.4V may not provide sufficient delays at higher operation voltage suchas 0.5V. The selectable delay buffers 318 used in the example logiccircuit 300 allow for the correction of potential hold time violationswhen operating at different ULV levels so that the circuit is not overdesigned for maximum delay paths or under designed for minimum delaypaths. This can provide significant power performance area (PPA) benefitfor IoT/automotive applications. Use of the selectable delay buffers 318in ultra low voltage designs employed in a dynamic voltage scalingenvironment provides the ability to intrinsically tune the delays ofdata and clock paths as a function of the operating voltage. This allowsfor setup and hold critical timing paths to be optimized for multiplevoltage regimes.

The examples in FIGS. 3A and 3B illustrate how the selectable delaybuffers 318 may be used for tuning maximum delay paths. FIG. 3A providesexample minimum and maximum timing characteristics of the circuitoperating at 0.4V when a first delay segment of the selectable delaybuffer 318 is selected. In this example, the them for the second flipflop is 4 ns and the maximum capture path time for the clock path is 15ns. Thus, four delay buffers 318 with team of 2 ns are used to set theminimum data arrival time in the data path to 19 ns to ensure correctcircuit operation. As illustrated in FIG. 3B, the same circuit 300operated at 0.5V may have different timing characteristics. In thisexample, the t_(setup) for the second flip flop is 4.5 ns and theminimum capture path time for the clock path is 6 ns. The maximum dataarrival time in the data path using the four delay buffers 318 with thefirst delay segment selected would be 19.5 ns yielding a minimum T_(CLK)of 18 ns for the system clock. By using the second delay segment in thefour delay buffers 318, in this example, t_(max) for each delay bufferdrops to 1.5 ns, the maximum data arrival time in the data path usingthe four delay buffers 318 with the second delay segment selected wouldbe 15.5 ns yielding a minimum T_(CLK) of 14 ns for the system clock.Thus, higher maximum clock frequencies may be employed at the higher0.5V operating voltage level because shorter delay paths may be employedin the delay buffers 318.

As another example, FIGS. 4A and 4B illustrate how selectable delaybuffers may be used for tuning minimum delay paths. FIGS. 4A and 4B areschematic diagrams of another example synchronous VLSI logic circuit400. The circuit includes a first memory element, flip flop 410, and asecond memory element, flip flop 412, with a data path and a clock pathcoupled between them. The data path includes an inverter 414 and an ANDgate 415 for processing the output of the first memory element 410before it is stored in the second memory element 412. The clock pathincludes a buffer 416 for buffering a clock signal that is used by thefirst and second memory elements to synchronize the storage and outputof data. The example logic circuit 400 includes a selectable delaybuffer 418 that allows for the correction of potential hold timeviolations when operating at different ULV levels.

The examples in FIGS. 4A and 4B illustrate how the selectable delaybuffers 418 may be used for tuning minimum delay paths. FIG. 4A providesexample minimum and maximum timing characteristics of the circuitoperating at 0.4V when a first delay segment of the selectable delaybuffer 418 is selected. In this example, the t_(hold) for the secondflip flop is 4 ns and the maximum capture path time for the clock pathis 15 ns. Thus, one delay buffer 418 with t_(min) of 2 ns is used to setthe minimum data arrival time in the data path to 19 ns to ensurecorrect circuit operation. As illustrated in FIG. 4B, the same circuit400 operated at 0.5V may have different timing characteristics. In thisexample, the t_(hold) for the second flip flop is 2 ns and the maximumcapture path time for the clock path is 10.5 ns. The minimum dataarrival time in the data path using the delay buffers 418 with the firstdelay segment selected would be 10.5 ns, which is not long enough. Byusing the second delay segment in the delay buffer 418, in this example,t_(min) for the delay buffer increases to 3 ns and the minimum dataarrival time in the data path using the delay buffer 418 with the seconddelay segment selected would be 12.5 ns. Thus, a potential holdviolation is corrected at the higher 0.5V operating voltage level byusing the second delay segment in the delay buffer 418.

FIG. 5 is a schematic diagram of an example control signal generatingcircuit 500 for generating control signals for choosing delay paths in aselectable delay buffer 510. The example selectable delay buffer 502 hasa delay segment section 504 with four selectable delay segments foroperation at four different operating voltages such as 0.4V, 0.5V, 0.6V,and 0.7V. Each delay segment is configured to pass an input signal to anoutput terminal 505 within a different range of time delays (i.e.,t_(min) and t_(max)). The example selectable delay buffer 502 also has asegment selection switch 506 that is configured to selectively couplethe delay segments to the output terminal 505 based on selectioninformation that indicates which delay segment to couple to the outputterminal 505. The segment selection switch 506 in this example is a 4×1multiplexer.

The example control signal generating circuit 500 includes a comparatorcircuit 508 and signal generator circuit 510. In this example, thecomparator circuit 508 includes three op-amps utilized as comparatorsthat compare the voltage level at a voltage source to a referencevoltage. The signal generator circuit 510, in this example, usescombinational logic to generate selection information based on thecomparison of the voltage source voltage level to the reference voltagelevels. Also shown in FIG. 5 is a table that illustrates signals atvarious nodes during the generation of selection information.

FIG. 6 is a schematic diagram of an example logic element 600 that hasbeen configured with selectable delays. A logic cell with selectabledelays may be used for the same purpose as selectable delay buffers. Theexample logic element 600 is a selectable delay 2-input NAND gate thatincludes a logic section 602 and a selectable delay section 604. Theselectable delay section 604 includes a first selectable delay buffer605 and a second selectable delay buffer 607 wherein the firstselectable delay buffer 605 is configured to provide a selectable delayfor a first input signal A to the logic gate 602 and the secondselectable delay buffer 607 is configured to provide a second selectabledelay for a second input signal B to the logic gate 602.

The first selectable delay buffer 605 comprises a first delay segmentsection 606 with four selectable delay segments for operation at fourdifferent operating voltages such as 0.4V, 0.5V, 0.6V, and 0.7V. Thesecond selectable delay buffer 607 comprises a second delay segmentsection 608 with four selectable delay segments for operation at fourdifferent operating voltages such as 0.4V, 0.5V, 0.6V, and 0.7V. Eachdelay segment is configured to pass an input signal to an outputterminal 609 within a different range of time delays (i.e., t_(min) andt_(max)).

The first selectable delay buffer 605 also comprises a first segmentselection switch 610 that is configured to selectively couple the delaysegments of the first delay segment section 606 to the output terminal609 based on selection information that indicates which delay segment tocouple to the output terminal 609. The second selectable delay buffer607 also comprises a second segment selection switch 612 that isconfigured to selectively couple the delay segments of the second delaysegment section 608 to the output terminal 609 based on selectioninformation that indicates which delay segment to couple to the outputterminal 609. Each segment selection switch 610, 612 in this example isa 4×1 multiplexer.

The first delay segment section 606 is coupled to the A input of theNAND gate and the second delay segment section 608 is coupled to the Binput to delay the NAND gate output based on the selected delaysegments. Although this example shows a selectable delay section 604coupled to the NAND gate input, in another example a selectable delaysection may be coupled to the NAND gate output.

FIG. 7 is a schematic diagram of another example selectable delay buffer700. The example selectable delay buffer 700 is configured withdifferent types of selectable delay buffer elements in delay segments.In this example, the selectable delay buffer 700 includes a first delaysegment 702 and a second delay segment 704. The first delay segment 702includes a first delay buffer element 706. The second delay segment 704includes a second delay buffer element 708 and a third delay bufferelement 710.

Each of the buffer elements 706, 708, 710 includes multiple delaysegments configured to delay an input signal based on selectioninformation provided to a segment selection switch that is configured toselectively couple the delay segments to an output terminal. The exampleselectable delay buffer 700 may obtain a larger range of tunable delaysby using different types of selectable delay buffer elements.

FIG. 8 is a process flow chart depicting an example method in asynchronous circuit having a selectable delay buffer for tuning a delaypath in the synchronous circuit. The example method comprises comparingthe voltage level of a voltage source to one or more reference voltagelevels (operation 802). The example method further comprises selecting adelay segment in a selectable delay buffer (operation 804) and couplingthe selected delay segment into a delay path in the synchronous circuit(operation 806).

Comparing the voltage level of a voltage source to one or more referencevoltage levels may comprise generating selection information based onthe comparison of the voltage source voltage level to the referencevoltage levels (operation 810). Selecting a delay segment in aselectable delay buffer comprises selecting a first delay segment in aselectable delay buffer when the voltage level comparison indicates useof the first delay segment (operation 812), selecting a second delaysegment in the selectable delay buffer when the voltage level comparisonindicates use of the second delay segment (operation 814), and selectinga another delay segment (e.g., any additional delay segment includingthe final delay segment if additional delay segments exist) in theselectable delay buffer when the voltage level comparison indicates useof another delay segment (operation 816).

The delay path may be a data signal propagating path. The delay path maybe a clock signal propagating path. The comparing the voltage level of avoltage source to one or more reference voltage levels may compriseusing a comparator circuit comprising a plurality of operationalamplifiers to compare the voltage level of the voltage source to the oneor more reference voltage levels in a manner similar to that depicted inthe example in FIG. 5. The selecting a first delay segment and theselecting a second delay segment may comprise using a multiplexer forthe selecting in a manner similar to that depicted in the example inFIG. 5. The comparator circuit may be configured to generate one or moreselection signals for use by the multiplexer for the selecting. This maybe accomplished in a manner similar to that depicted in the example inFIG. 5.

Described herein are example delay buffers and other logic cellsoffering a range of selectable timing characteristics depending on theoperating voltage of the design block. Also described is an examplemethod of generating select control signals based on the operatingvoltage to choose the appropriate tunable delay path in the selectablebuffers.

Although the foregoing examples illustrate that the delay path that isadjusted using the selectable delay buffers may be a data signalpropagating path, the selectable delay buffers may also be used in adelay path that is a clock signal propagating path.

These examples illustrate the application of voltage selectable delaybuffers and logic cells for ULV designs in a DVS environment, theability to dynamically tune the delays of buffers and logic cells in maxdelay and min delay paths, the design of variable delay buffers andlogic cells, and methods for generating control signals for selectabledelay buffers. Advantages that may be realized from these examplesinclude a higher maximum operating frequency when functioning at ahigher operating voltage, reduced design effort to fix hold violations,and improved power performance area (PPA) for ULV designs forIoT/automotive products.

In one embodiment, disclosed is a selectable delay buffer for tuning adelay path in a circuit. The selectable delay buffer comprises a firstdelay segment configured to pass an input signal to an output terminalwithin a first range of time delays, a second delay segment configuredto pass the input signal to the output terminal within a second range oftime delays that is different from the first range, and a segmentselection switch configured to selectively couple the delay segments tothe output terminal based on received selection information thatindicates which delay segment to couple to the output terminal.

These aspects and other embodiments may include one or more of thefollowing features. The segment selection switch may comprise amultiplexer. The selectable delay buffer may further comprise one ormore additional delay segments wherein each additional delay segment isconfigured to pass the input signal to the output terminal within arange of time delays that is different from the other range of timedelays and wherein the segment selection switch is configured toselectively couple the additional delay segments to the output terminalbased on the received selection information. The selection informationmay comprise two or more selection signals. The selectable delay buffermay further comprise a fixed delay section and an adjustable delaysection comprising the first delay segment, the second delay segment,and the segment selection switch. The segment selection switch may beconfigured to select one of the delay segments when operating at a firstvoltage level and configured to select another of the delay segmentswhen operating at a second voltage level. The selectable delay buffermay further comprise a selection information generating circuit whereinthe selection information generating circuit comprises a comparatorcircuit for comparing the voltage level at a voltage source to aplurality of reference voltage levels, and a signal generator circuitfor generating the selection information based on the comparison of thevoltage source voltage level to the reference voltage levels. Thecomparator circuit may comprise a plurality of operational amplifiersand the signal generator circuit may comprise a plurality of logiccells.

In another embodiment, disclosed is a synchronous circuit that includesa logic gate configured to perform an operation on a data signal, amemory element that is configured to store the state of the operated-ondata signal when triggered by a clock signal, and a selectable delaybuffer for tuning a delay path in the synchronous circuit. Theselectable delay buffer comprises a first delay segment configured topass one of the clock signal or the data signal to an input of thememory element within a first range of time delays, a second delaysegment configured to pass the one of the clock signal or the datasignal to the input of the memory element within a second range of timedelays that is different from the first range, and a segment selectionswitch configured to selectively couple the delay segments to the inputof the memory element based on received selection information. Thesegment selection switch is configured to select the first delay segmentto complete a delay path at a first supply voltage level and the segmentselection switch is configured to select the second delay segment tocomplete the delay path at a second supply voltage level.

These aspects and other embodiments may include one or more of thefollowing features. The memory element may comprise a flip flop. Thedelay path may be a data signal propagating path. The delay path may bea clock signal propagating path. The synchronous circuit may furthercomprise a selection information generating circuit. The selectioninformation generating circuit may comprise a comparator circuit forcomparing the voltage level at a voltage source to the first supplyvoltage level and the second supply voltage level and a signal generatorcircuit for generating the selection information based on the comparisonof the voltage source voltage level to the first supply voltage leveland the second supply voltage level. The comparator circuit may comprisea plurality of operational amplifiers. The signal generator circuit maycomprise a plurality of logic cells.

In another embodiment, disclosed is a circuit for generating controlinformation for a selectable delay element having a first delay segmentconfigured to pass an input signal to an output terminal within a firstrange of time delays, a second delay segment configured to pass theinput signal to the output terminal within a second range of time delaysthat is different from the first range, and a segment selection switchconfigured to selectively couple the delay segments to the outputterminal based on selection information that indicates which delaysegment to couple to the output terminal. The circuit comprises acomparator circuit for comparing the voltage level at a voltage sourceto a plurality of reference voltage levels and a signal generatorcircuit for generating selection information based on the comparison ofthe voltage source voltage level to the reference voltage levels.

These aspects and other embodiments may include one or more of thefollowing features. The comparator circuit may comprise a plurality ofoperational amplifiers. The signal generator circuit may comprise aplurality of logic cells.

In another embodiment, disclosed is a logic element comprising a logicgate coupled to one or more selectable delay buffers. Each selectabledelay buffer comprises a first delay segment configured to pass adigital signal to an output terminal within a first range of timedelays, a second delay segment configured to pass the digital signal tothe output terminal within a second range of time delays that isdifferent from the first range, and a segment selection switchconfigured to selectively couple the delay segments to the outputterminal based on received selection information that indicates whichdelay segment to couple to the output terminal.

These aspects and other embodiments may include one or more of thefollowing features. The selectable delay buffers may comprise a firstselectable delay buffer and a second selectable delay buffer wherein thefirst selectable delay buffer is configured to provide a selectabledelay for a first input signal to the logic gate and the secondselectable delay buffer is configured to provide a second selectabledelay for a second input signal to the logic gate. Alternatively, thelogic gate may provide the digital signal to the selectable delaybuffer.

In another embodiment, disclosed is a logic cell with selectable delaypaths comprising a logic gate, a first delay segment configured to passa digital signal to an output terminal within a first range of timedelays, a second delay segment configured to pass the digital signal tothe output terminal within a second range of time delays that isdifferent from the first range, and a segment selection switchconfigured to selectively couple the delay segments to the outputterminal based on received selection information that indicates whichdelay segment to couple to the output terminal.

In yet another embodiment, disclosed is a selectable delay buffer fortuning a delay path in a circuit. The selectable delay buffer include aplurality of selectable delay buffer elements. Each selectable delaybuffer element comprises a first delay segment configured to pass aninput signal to a delay buffer element output terminal within a firstrange of time delays, a second delay segment configured to pass theinput signal to the output terminal within a second range of time delaysthat is different from the first range, and a segment selection switchconfigured to selectively couple the delay segments to the outputterminal based on received selection information that indicates whichdelay segment to couple to the output terminal.

These aspects and other embodiments may include one or more of thefollowing features. The plurality of selectable delay buffer elementsmay comprise a first selectable delay buffer element in a first paththat is parallel to a second path containing a second selectable delaybuffer element, and a path selection switch configured to selectivelycouple the first path and the second path to a selectable delay bufferoutput terminal based on received selection information that indicateswhich of the first path or second path to couple to the selectable delaybuffer output terminal. The plurality of selectable delay bufferelements may comprise a third selectable delay buffer element in serieswith the second selectable delay buffer element in the second path.

In another embodiment, disclosed is a method in a synchronous circuithaving a selectable delay buffer for tuning a delay path in thesynchronous circuit. The method comprises comparing the voltage level ofa voltage source to one or more reference voltage levels, selecting afirst delay segment in a selectable delay buffer when the voltage levelcomparison indicates use of the first delay segment, selecting a seconddelay segment in the selectable delay buffer when the voltage levelcomparison indicates use of the second delay segment, and coupling theselected delay segment into a delay path in the synchronous circuit.

These aspects and other embodiments may include one or more of thefollowing features. The delay path may be a data signal propagatingpath. The delay path may be a clock signal propagating path. Thecomparing the voltage level of a voltage source to one or more referencevoltage levels may comprise using a comparator circuit comprising aplurality of operational amplifiers to compare the voltage level of thevoltage source to the one or more reference voltage levels. Theselecting a first delay segment and the selecting a second delay segmentmay comprise using a multiplexer for the selecting. The comparatorcircuit may be configured to generate one or more selection signals foruse by the multiplexer for the selecting.

The foregoing outlines features of several embodiments so that thoseskilled in the art may better understand the aspects of the presentdisclosure. Those skilled in the art should appreciate that they mayreadily use the present disclosure as a basis for designing or modifyingother processes and structures for carrying out the same purposes and/orachieving the same advantages of the embodiments introduced herein.Those skilled in the art should also realize that such equivalentconstructions do not depart from the spirit and scope of the presentdisclosure, and that they may make various changes, substitutions, andalterations herein without departing from the spirit and scope of thepresent disclosure.

What is claimed is:
 1. A selectable delay buffer for tuning a delay pathin a circuit, comprising: a first delay segment configured to pass aninput signal to an output terminal within a first range of time delays;a second delay segment configured to pass the input signal to the outputterminal within a second range of time delays that is different from thefirst range; and a segment selection switch configured to selectivelycouple the delay segments to the output terminal based on receivedselection information that indicates which delay segment to couple tothe output terminal.
 2. The selectable delay buffer of claim 1, whereinthe segment selection switch comprises a multiplexer.
 3. The selectabledelay buffer of claim 1, further comprising one or more additional delaysegments wherein each additional delay segment is configured to pass theinput signal to the output terminal within a range of time delays thatis different from the other range of time delays and wherein the segmentselection switch is configured to selectively couple the additionaldelay segments to the output terminal based on the received selectioninformation.
 4. The selectable delay buffer of claim 3, wherein theselection information comprises two or more selection signals.
 5. Theselectable delay buffer of claim 1, further comprising a fixed delaysection and wherein the first delay segment, the second delay segment,and the segment selection switch form an adjustable delay section. 6.The selectable delay buffer of claim 1, wherein the segment selectionswitch is configured to select one of the delay segments when operatingat a first voltage level and configured to select another of the delaysegments when operating at a second voltage level.
 7. The selectabledelay buffer of claim 1, further comprising a selection informationgenerating circuit, the selection information generating circuitcomprising: a comparator circuit for comparing the voltage level at avoltage source to a plurality of reference voltage levels; and a signalgenerator circuit for generating the selection information based on thecomparison of the voltage source voltage level to the reference voltagelevels.
 8. The selectable delay buffer of claim 7, wherein thecomparator circuit comprises a plurality of operational amplifiers andwherein the signal generator circuit comprises a plurality of logiccells.
 9. The selectable delay buffer of claim 7, wherein the signalgenerator circuit uses combinational logic comprising an XNOR gate. 10.A method for tuning a delay path in a circuit, the method comprising:passing, using a first delay segment, an input signal to an outputterminal within a first range of time delays; passing, using a seconddelay segment, the input signal to the output terminal within a secondrange of time delays that is different from the first range; andselectively coupling, using a segment selection switch, the delaysegments to the output terminal based on received selection informationthat indicates which delay segment to couple to the output terminal. 11.The method of claim 10, wherein the segment selection switch comprises amultiplexer.
 12. The method of claim 10, further comprising: passing,using one or more additional delay segments, the input signal to theoutput terminal within a range of time delays that is different from theother range of time delays; and selectively coupling, using the segmentselection switch, the additional delay segments to the output terminalbased on the received selection information.
 13. The method of claim 12,wherein the selection information comprises two or more selectionsignals.
 14. The method of claim 10, wherein the first delay segment,the second delay segment, and the segment selection switch form anadjustable delay section.
 15. The method of claim 10, further comprisingselecting, using the segment selection switch, one of the delay segmentswhen operating at a first voltage level and selecting another of thedelay segments when operating at a second voltage level.
 16. The methodof claim 10, further comprising: comparing, using a comparator circuitof a selection information generating circuit, the voltage level at avoltage source to a plurality of reference voltage levels; andgenerating, using a signal generator circuit, the selection informationbased on the comparison of the voltage source voltage level to thereference voltage levels.
 17. The method of claim 16, wherein thecomparator circuit comprises a plurality of operational amplifiers andwherein the signal generator circuit comprises a plurality of logiccells.
 18. The method of claim 16, wherein the signal generator circuituses combinational logic comprising an XNOR gate.
 19. A selectable delaybuffer for tuning a delay path in a circuit, comprising: a first delaysegment configured to pass an input signal to an output terminal withina first range of time delays; a second delay segment configured to passthe input signal to the output terminal within a second range of timedelays that is different from the first range; a segment selectionswitch configured to selectively couple the delay segments to the outputterminal based on received selection information that indicates whichdelay segment to couple to the output terminal; and a signal generatorcircuit for generating the selection information based on a comparisonof the voltage level at a voltage source to a plurality of referencevoltage levels, using combinational logic comprising an XNOR gate. 20.The selectable delay buffer of claim 19, further comprising: acomparator circuit for comparing the voltage level at the voltage sourceto the plurality of reference voltage levels.